Papers - KOBAYASHI Naritaka
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Investigation on Nanoscale Processes on the BaF2(111) Surface in Various Solutions by Frequency Modulation Atomic Force Microscopy Reviewed
Naritaka Kobayashi, Ryuzo Kawamura, Hiroshi Y Yoshikawa, Seiichiro Nakabayashi
Journal of Applied Physics 119 214308 2016.6
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Photosensitizer-Conjugated Ultrasmall Carbon Nanodots as Multifuncional Fluorescent Probes for Bioimaging Reviewed
Alexandre Loukanov, Ryota Sekiya, Midori Yoshikawa, Naritaka Kobayashi, Yuji Moriyasu, Seiichiro Nakabayashi
Journal of Physical Chemistry C 120 15867 - 15874 2016.4
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A Relationship between Three-Dimensional Surface Hydration Structure and Force Distribution Measured by Atomic Force Microscopy Reviewed
Keisuke Miyazawa, Naritaka Kobayashi, Matthew Watkins, Alexander Shluger, Ken-ichi Amano, Takeshi Fukuma
Nanoscale 8 7334 - 7342 2016.3
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Quantitative Evaluation of Cancer Cell Adhesion to Self-Assembled Monolayer-Patterned Substrates by Reflection Interference Contrast Microscopy Reviewed
Takahisa Matsuzaki, Kosaku Ito, Kentaro Masuda, Eisuke Kakinuma, Rumi Sakamoto, Kentaro Iketaki, Hideaki Yamamoto, Masami Suganuma, Naritaka Kobayashi, Seiichiro Nakabayashi, Takashi Tanii, Hiroshi Y Yoshikawa
Journal of Physical Chemistry B 120 1221 - 1227 2016.2
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Visualizing Nanoscale Distribution of Corrosion Cells by Open-Loop Electric Potential Microscopy Reviewed
Kyoko Honbo, Shoichiro Ogata, Takuya Kitagawa, Takahiro Okamoto, Naritaka Kobayashi, Itto Sugimoto, Shohei Shima, Akira Fukunaga, Chikako Takatoh, Takeshi Fukuma
ACS Nano 10 2575 - 2583 2016.1
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Nanoscale Corrosion Behavior of Polycrystalline Copper Fine Wires in Dilute NaCl Solution Investigated by In-situ Atomic Force Microscopy Reviewed
Shoichiro Ogata, Naritaka Kobayashi, Takuya Kitagawa, Shohei Shima, Akira Fukunaga, Chikako Takatoh, Takeshi Fukuma
Corrosion Science 105 177 - 182 2016.1
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Mechanism of Atomic Force Microscopy Imaging of Three-Dimensional Hydration Structures at a Solid-Liquid Interface Reviewed
Takeshi Fukuma, Bernhard Reischl, Naritaka Kobayashi, Peter Spijker, Fillip Federici Canova, Keisuke Miyazawa, Adam S. Foster
Physical Review B 92 155412 2015.10
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Atomic-Scale Processes at the Fluorite-Water Interface Visualized by Frequency Modulation Atomic Force Microscopy Reviewed
Naritaka Kobayashi, Shirou Itakura, Hitoshi Asakawa,Takeshi Fukuma
Journal of Physical Chemistry C 117 24388 - 24396 2013.10
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Dual Frequency Open-Loop Electric Potential Microscopy for Local Potential Measurements in Electrolyte Solution with High Ionic Strength Reviewed
Naritaka Kobayashi, Hitoshi Asakawa, Takeshi Fukuma
Review of Scientific Instruments 83 033709 2012.3
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Atomic-Resolution Imaging in Liquid by Frequency Modulation Atomic Force Microscopy Using Small Cantilevers with Megahertz-Order Resonance Frequencies Reviewed
Takeshi Fukuma, Kyosuke Onishi, Naritaka Kobayashi, Atsushi Matsuki, Hitoshi Asakawa
Nanotechnology 23 135706 2012.3
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Quantitative Potential Measurements of Nanoparticles with Different Surface Charges in Liquid by Open-Loop Electric Potential Microscopy Reviewed
Naritaka Kobayashi, Hitoshi Asakawa, Takeshi Fukuma
Journal of Applied Physics 110 044315 2011.8
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Nanoscale Potential Measurements in Liquid by Frequency Modulation Atomic Force Microscopy Reviewed
Naritaka Kobayashi, Hitoshi Asakawa, Takeshi Fukuma
Review of Scientific Instruments 81 123705 2010.12
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High Force Sensitivity in Q-Controlled Phase-Modulation Atomic Force Microscopy Reviewed
Naritaka Kobayashi, Yan Jun Li, Yoshitaka Naitoh, Masami Kageshima, Yasuhiro Sugawara
Applied Physics Letters 97 011906 2010.7
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Multifrequency High-Speed Phase-Modulation Atomic Force Microscopy in Liquids Reviewed
Yan Jun Li, Kouhei Takahashi, Naritaka Kobayashi, Yoshitaka Naitoh, Masami Kageshima, Yasuhiro Sugawara
Ultramicroscopy 110 582 - 584 2010.2
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High-Speed Phase-Modulation Atomic Force Microscopy (PM-AFM) in Constant-Amplitude (CA) Mode Capable of Simultaneous Measurement of Topography and Energy Dissipation Reviewed
Yan Jun Li, Naritaka Kobayashi, Hikaru Nomura, Yoshitaka Naitoh, Masami Kageshima, Yasuhiro Sugawara
Japanese Journal of Applied Physics 47 6121 2008.7
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Phase Modulation Atomic Force Microscopy in Constant Excitation Mode Capable of Simultaneous Imaging of Topography and Energy Dissipation Reviewed
Yan Jun Li, Naritaka Kobayashi, Yoshitaka Naitoh, Masami Kageshima, Yasuhiro Sugawara
Applied Physics Letters 92 121903 2008.3
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Theoretical Investigation on Force Sensitivity in Q-Controlled Phase-Modulation Atomic Force Microscopy in Constant-Amplitude Mode Reviewed
Naritaka Kobayashi, Yan Jun Li, Yoshitaka Naitoh, Masami Kageshima, Yasuhiro Sugawara
Journal of Applied Physics 103 054305 2008.3
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Elimination of Nonlinear Cantilever Dynamics in Phase Modulation Atomic Force Microscopy (PM-AFM) in Constant Amplitude Mode Reviewed
Yasuhiro Sugawara, Naritaka Kobayashi, Masayo Kawakami, Yan Jun Li, Yoshitaka Naitoh, Masami Kageshima
Applied Physics Letters 90 194104 2007.5
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High-Sensitivity Force Detection by Phase-Modulation Atomic Force Microscopy Reviewed
Naritaka Kobayashi, Yan Jun Li, Yoshitaka Naitoh, Masami Kageshima, Yasuhiro Sugawara
Japanese Journal of Applied Physics 45 L793 - L796 2006.7