Updated on 2023/09/01

写真a

 
YANAGISAWA Junichi
 
Organization
Faculty of Advanced Engineering
Department
School of Engineering Department of Electronic Systems Engineering
Title
Professor
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Education

  • Osaka University   Graduate School, Division of Engineering Science

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    Course completed: Doctor's Course

    Country: Japan

  • Osaka Prefecture University   Graduate School, Division of General Science

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    Course completed: Master's Course

    Country: Japan

  • Shinshu University   Faculty of Science

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    Country: Japan

Degree

  • 工学博士 ( 1991.3   大阪大学 )

  • 学術修士 ( 1988.3   大阪府立大学 )

  • 理学士 ( 1986.3   信州大学 )

Research Field

  • Semiconductor process engineering, Ion beam engineering

Research Experience

  • The University of Shiga Prefecture   Professor

    2008.4

  • 大阪大学大学院基礎工学研究科   准教授

    2007.4 - 2008.3

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    Country:Japan

  • 大阪大学大学院基礎工学研究科   助教授

    2003.4 - 2007.3

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    Country:Japan

  • 大阪大学大学院基礎工学研究科   講師

    1997.4 - 2003.3

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    Country:Japan

  • 大阪大学基礎工学部   助手

    1991.4 - 1997.3

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    Country:Japan

Association Memberships

  • 日本表面真空学会

    2017.6

  • 日本物理教育学会

    2012.12

  • 日本高圧力学会

    2008.4

  • 応用物理学会

    2008.4

  • 日本物理学会

    2008.4

Research Areas

  • Nanotechnology/Materials / Thin film/surface and interfacial physical properties

  • Manufacturing Technology (Mechanical Engineering, Electrical and Electronic Engineering, Chemical Engineering) / Electron device and electronic equipment

  • Manufacturing Technology (Mechanical Engineering, Electrical and Electronic Engineering, Chemical Engineering) / Electric and electronic materials

Available Technology

  • イオンビームプロセスを主とした超微細加工技術の新展開

Papers

  • Reflective waveplate with subwavelength grating structure

    Itsunari Yamada, Takaaki Ishihara and Junichi Yanagisawa

    Jpn. J. Appl. Phys.   54   092203-1 - 0922003-4   2015

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    Language:English   Publishing type:Research paper (scientific journal)   Participation form:Joint(The vice charge)  

  • Deformable Silicone Grating with Submicrometer Period

    T. Ishihara, I. Yamada, J. Yanagisawa, J. Nishii, and M. Saito

    Jpn. J. Appl. Phys.   2014

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    Language:English   Publishing type:Research paper (scientific journal)   Participation form:Joint(The vice charge)  

  • Effect of Low-Energy Ga Ion Implantation on Selective Growth of Gallium Nitride Layer on Silicon Nitride Surfaces Using Metal Organic Chemical Vapor Deposition

    K. Ishiizumi, J. Kikkawa, Y. Nakamura, A. Sakai, and J. Yanagisawa

    Jpn. J. Appl. Phys.   50   06GC02   2011

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  • Frequency-tunable terahertz electromagnetic wave emitters based on undoped GaAs/n-type GaAs epitaxial layer structures utilizing sub-picosecond-range carrier-transport processes

    Hideo Takeuchi , Junichi Yanagisawa, Shuichi Tsuruta, Hisashi Yamada, Makoto Hata, and Masaaki Nakayama

    Journal of Luminescence   131   531 - 534   2011

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  • Simple strategy for enhancing terahertz emission from coherent longitudinal optical phonons using undoped GaAs/n-type GaAs epitaxial layer structures

    Hideo Takeuchi, Junichi Yanagisawa, Shuichi Tsuruta, Hishashi Yamada, Masahiko Hata, and Masaaki Nakayama

    Physica Status Solidi C   8   343 - 345   2011

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  • Direction reversal of the surface band bending in GaAs-based dilute nitride epitaxial layers investigated by polarity of terahertz electromagnetic waves

    H. Takeuchi, J. Yanagisawa, and M.Nakayama

    Physics Procedia   3   1109 - 1113   2010

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  • Frequency shift of terahertz electromagnetic waves originating from sub-picosecond-range carrier transport in undoped GaAs/n-type GaAs epitaxial layer structures

    Hideo Takeuchi, Junichi Yanagisawa, Shuichi Tsuruta, Hisashi Yamada, Makoto Hata, and Masaaki Nakayama

    Japanese Journal of Applied Physics   49   082001 1-5   2010

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  • Observation and quantification of the direction reversal of the surface band bending in GaAs1-xNx using terahertz electromagnetic wave and photoreflectance measurements

    Hideo Takeuchi, Junichi Yanagisawa, Jun Hashimoto, and Masaaki Nakayama

    Physica Status Solidi C   7   1844 - 1846   2010

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  • 集束イオンビーム支援堆積法で形成したカーボン系薄膜の機械的特性

    柳沢淳一

    電気学会論文誌A   130   949 - 954   2010

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  • Effect of Annealing on Mechanical Properties of Materials Formed by Focused Au or Si Ion-Beam-Induced Chemical Vapor Deposition Using Phenanthrene

    T. Yo, H. Tanaka, T. Nagata, N. Fukata, T. Chikyow, A. Sakai, and J. Yanagisawa

    Jpn. J. Appl. Phys.   48   06FB03   2009

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  • Fabrication of micro-fluid-channel structures by focused ion beam technique

    J. Yanagisawa, H. Kobayashi, K. Koreyama, and Y. Akasaka

    Mater. Res. Soc. Symp. Proc.   1181   1181-DD03-01   2009

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  • Intense emission of terahertz electromagnetic wave from an undoped GaAs/n -type GaAs epitaxial layer structure

    H. Takeuchi, J. Yanagisawa, T. Hasegawa, and M. Nakayama

    Physica Status Solidi ©   6   1513 - 1516   2009

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  • Effects of nitrogen incorporation on a direction of a surface band bending investigated by polarity of terahertz electromagnetic waves in GaAs(1-x)N(x) epitaxial layers

    H. Takeuchi, J. Yanagisawa, J. Hashimoto, and M. Nakayama

    J. Appl. Phys.   105   093539   2009

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  • Characterization of Deposited Materials Formed by Focused Ion Beam-Induced Chemical Vapor Deposition Using AuSi Alloyed Metal Source

    T. Yo, H. Tanaka, K. Koreyama, T. Nagata, Y. Sakuma, K. Nakajima, T. Chikyow, J. Yanagisawa, and A. Sakai

    Jpn. J. Appl. Phys.   47   5018 - 5021   2008

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  • Enhancement of terahertz electromagnetic wave emission from an undoped GaAs/n-type GaAs epitaxial layer structure

    H. Takeuchi, J. Yanagisawa, T. Hasegawa, and M. Nakayama

    Appl. Phys. Lett.   93   081916   2008

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  • Effects of Ga ion irradiation on growth of GaN on SiN substrates by electron cyclotron resonance-assisted molecular beam epitaxy

    J. Yanagisawa, H. Matsumoto, T. Fukuyama, Y. Shiraishi, T. Yodo, and Y. Akasaka

    Nucl. Instr. and Meth. B   257   348 - 351   2007

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  • Deposition of carbonaceous structures using focused Au and Si ion-beam-induced chemical vapor deposition methods

    R. Okada, T. Yo, J. Yanagisawa, and S. Matsui

    J. Vac. Sci. Technol. B   25   2180 - 2183   2007

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  • Nano-porous structure formations on germanium surfaces by focused ion beam irradiations

    J. Yanagisawa, K. Takarabe, K. Ogushi, K. Gamo, and Y. Akasaka

    J. Phys.: Condens. Matter   19   445002   2007

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  • Formation of local ferromagnetic areas on GaAs by focused Mn ion beam implantation

    M. Kasai, J. Yanagisawa, H. Tanaka, S. Hasegawa, H. Asahi, K. Gamo, and Y. Akasaka

    Nucl. Instr. and Meth. B   242   240 - 243   2006

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  • Formation and characterization of swelled nano-porous structures on ion-irradiated Ge surfaces

    J. Yanagisawa, K. Ogushi, K. Takarabe, K. Gamo, and Y. Akasaka

    Mater. Res. Soc. Symp. Proc.   908E   0908-OO11-04.1   2006

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  • Formation of GaN layer on SiN surface using low-energy Ga ion implantation

    J. Yanagisawa, M. Toda, T. Kitamura, H. Matsumoto, and Y. Akasaka

    J. Vac. Sci. Technol. B   23   3205 - 3208   2005

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  • Formation of GaN films by Ga ion direct deposition under nitrogen radical atmosphere

    M. Toda, J. Yanagisawa, K. Gamo, and Y. Akasaka

    J. Vac. Sci. Technol. B   22   3012 - 3015   2004

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  • Maskless Mn implantation in GaAs using focused Mn ion beam

    M. Itou, M. Kasai, T. Kimura, J. Yanagisawa, F. Wakaya, Y. Yuba, and K. Gamo

    Nucl. Instr. and Meth. B   206   1013 - 1017   2003

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  • In situ Si Doping in GaAs using Low-energy Focused Si Ion Beam/Molecular Beam Epitaxy Combined System

    K. Kubo, J. Yanagisawa, F. Wakaya, Y. Yuba, and K. Gamo

    Proc. of 17th International Conference on the Application of Accelerators in Research and Industry   662 - 665   2003

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  • Carrier activation in in situ Si-doped GaAs layers fabricated by a focused Si ion beam and molecular beam epitaxy combined system

    T. Hada, H. Miyamoto, J. Yanagisawa, F. Wakaya, Y. Yuba, and K. Gamo

    Nucl. Instr. and Meth. B   175-177   751 - 755   2001

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  • Formation of narrow grooves on thin metal layer by focused ion beam etching

    M. Yoshida, S. Murakami, M. Nakayama, J. Yanagisawa, F. Wakaya, T. Kaito, and K. Gamo

    Microelectronic Engineering   57-58   877 - 882   2001

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  • Carrier distribution profiles in Si-doped layers in GaAs formed by focused ion beam implantation and successive overlayer growth

    T. Hada, T. Goto, J. Yanagisawa, F. Wakaya, Y. Yuba, and K. Gamo

    J. Vac. Sci. Technol. B   18   3158 - 3161   2000

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  • Galvanomagnetic effect of submicron exchange-coupled Co/Ni wire

    T. Kimura, F. Wakaya, J. Yanagisawa, Y. Yuba, K. Gamo

    Jpn. J. Appl. Phys.   39   6526 - 6529   2000

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  • Magnetization process and resistance jumps in a submicron-scale cross-shaped Co wire

    T. Kimura, F. Wakaya, J. Yanagisawa, Y. Yuba, and K. Gamo

    J. Mag. Mag. Mat.   222   79 - 85   2000

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  • Metastable domain structures of ferromagnetic microstructures observed by soft x-ray magnetic circular dichroism microscopy

    S. Imada, S. Ueda, R. Jung, Y. Saitoh, M. Kotsugi, W. Kuch, J. Gilles, S. Kang, F. Offi, J. Kirschner, H. Daimon, T. Kimura, J. Yanagisawa, K. Gamo, and S. Suga

    Jpn. J. Appl. Phys., Part 2   39   L585 - L587   2000

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  • Carier profiles and electron traps at a growth-interrupted layer in GaAs fabricated by a focused ion beam and molecular beam epitaxy combined system

    T. Goto, T. Hada, J. Yanagisawa, F. Wakaya, Y. Yuba, and K. Gamo

    Appl. Surface Sci.   159-160   277 - 281   2000

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  • Low-energy focused Si ion beam deposition under oxygen atmosphere

    J. Yanagisawa, Y. Wang, T. Hada, K. Murase, and K. Gamo

    Nucl. Instr. and Meth. B   148   42 - 46   1999

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  • Exchange interaction from current and voltage probes in galvanomagnetic effect in polycrystal Co thin film

    T. Kimura, F. Wakaya, J. Yanagisawa, Y. Yuba, and K. Gamo

    Jpn. J. Appl. Phys.   38   4737 - 4740   1999

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  • Focused ion beam process for formation of a metal/insulator/metal double tunnel junction

    M. Nakayama, J. Yanagisawa, F. Wakaya, and K. Gamo

    Jpn. J. Appl. Phys.   38   7151 - 7154   1999

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  • Carrier profile of the Si-doped layer in GaAs fabricated by a low-energy focused ion beam/molecular beam epitaxy combined system

    J. Yanagisawa, T. Goto, T. Hada, M. Nakai, F. Wakaya, Y. Yuba, and K. Gamo

    J. Vac. Sci. Technol. B   17   3072 - 3074   1999

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  • Interface states induced in GaAs by growth interruption during an in situ process

    F. Wakaya, T. Matsubara, M. Nakayama, J. Yanagisawa, Y. Yuba, S. Takaoka, K. Murase, and K. Gamo

    J. Vac. Sci. Technol. B   16   2313 - 2316   1998

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  • Effects of growth interruption in in situ process for buried quantum structures

    F. Wakaya, T. Matsubara, M. Nakayama, J. Yanagisawa, Y. Yuba, S. Takaoka, K. Murase, and K. Gamo

    Microelectronic Engineering   41/42   591 - 594   1998

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  • Focused ion beam etching of resist/Ni multilayer films and applications to metal island structure formation

    M. Nakayama, F. Wakaya, J. Yanagisawa, and K. Gamo

    J. Vac. Sci. Technol. B   16   2511 - 2514   1998

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  • Direct deposition of silicon and silicon-oxide films using low-energy Si focused ion beam

    J. Yanagisawa, H. Nakayama, O. Matsuda, K. Murase, and K. Gamo

    Nucl. Instr. Methods B   127/128   893 - 896   1997

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  • Fabrication of buried quantum structures using FIB-MBE total vacuum process

    F. Wakaya, J. Yanagisawa, T. Matsubara, H. Nakayama, Y. Yuba, S. Takaoka, K. Murase, and K. Gamo

    Microelectronic Engineering   35   451 - 454   1997

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  • Characterization of laterally selected Si doped layer formed in GaAs using a low-energy FIB-MBE combined system

    H. Nakayama, J. Yanagisawa, F. Wakaya, Y. Yuba, S. Takaoka, K. Murase, and K. Gamo

    Mat. Res. Soc. Symp. Proc.   438   187 - 192   1997

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  • Characterization of Si-doped layer in GaAs fabricated by a focused ion beam/molecular beam epitaxy combined system

    J. Yanagisawa, H. Nakayama, K. Oka, M. Nakai, F. Wakaya, Y. Yuba, S. Takaoka, K. Murase, and K. Gamo

    J. Vac. Sci. Technol. B   15   2930 - 2933   1997

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  • Formation of buried two-dimensional electron gas in GaAs by Si ion doping using MBE-FIB combined system

    J. Yanagisawa, H. Nakayama, F. Wakaya, Y. Yuba, and K. Gamo

    Mat. Res. Soc. Symp. Proc.   396   701 - 705   1996

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  • Investigation of growth interruption in the UHV total vacuum process for buried quantum structures

    F. Wakaya, T. Matsubara, J. Yanagisawa, Y. Yuba, S. Takaoka, K. Murase, and K. Gamo

    Microelectronic Engineering   30   475 - 478   1996

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  • Effects of growth interruption and FIB implantation in the UHV total vacuum process for the buried mesoscopic structures

    F. Wakaya, T. Matsubara, H. Nakayama, Y. Yanagisawa, Y. Yuba, S. Takaoka, K. Murase, and K. Gamo

    Physica B   227   268 - 270   1996

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  • Characterization of directly deposited silicon films using low-energy focused ion beam

    J. Yanagisawa, N. Onishi, H. Nakayama, and K. Gamo

    Jpn. J. Appl. Phys.   35   6584 - 6587   1996

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  • Fabrication of laterally selected Si doped layer in GaAs using a low-energy focused ion beam/molecular beam epitaxy combined system

    J. Yanagisawa, H. Nakayama, F. Wakaya, Y. Yuba, and K. Gamo

    J. Vac. Sci. Technol. B   14   3938 - 3941   1996

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  • Low-energy focused ion beam system and direct deposition of Au and Si

    J. Yanagisawa, K. Kito, K. Monden, and K. Gamo

    J. Vac. Sci. Technol. B   13   2621 - 2624   1995

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  • Transport properties and fabrication of coupled electron waveguides

    F. Wakaya, H. Otoi, J. Yanagisawa, Y. Yuba, S. Takaoka, K. Murase, K. Gamo, D. G. Hasko, G. A. C. Jones, and H. Ahmed

    Jpn. J. Appl. Phys.   34   4446 - 448   1995

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  • Flux dependence of implantation damage in GaAs induced by focused gallium ion beam

    M. Takai, S. Hara, T. Kishimoto, and J. Yanagisawa

    Proc. Ion Implantation Technology-94   856 - 859   1995

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  • Nuclear microprobe analysis of implantation damage induced by focused gallium ion beams in GaAs

    M. Takai, S. Hara, T. Kishimoto, and J. Yanagisawa

    Nucl. Instr. Methods B   104   524 - 527   1995

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  • Low energy ion irradiation effect on electron transport in GaAs/AlGaAs heterostructures

    J. Yanagisawa, A. Nozawa, Y. Yuba, S. Takaoka, K. Murase, and K. Gamo

    Mat. Res. Soc. Symp. Proc.   354   165 - 170   1995

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  • Low energy focused ion beam system combined with molecular beam epitaxy system for fabrication of 3-dimensional buried semiconductor structures

    J. Yanagisawa, K. Kito, K. Monden, and K. Gamo

    Proc. SPIE (Electron-Beam Sources and Charged-Particle Optics)   2522   406 - 411   1995

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  • Maskless deposition of Au on GaAs by low-energy focused ion beam

    K. Kito, J. Yanagisawa, K. Monden, H. Nakayama, Y. Yuba, and K. Gamo

    Jpn. J. Appl. Phys.   34   6853 - 6856   1995

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  • Low energy focused ion beam and buried electron waveguides fabrication

    F. Wakaya, A. Nozawa, J. Yanagisawa, Y. Yuba, S. Takaoka, K. Murase, and K. Gamo

    Microelectronic Engineering   23   123 - 126   1994

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  • Investigation of in situ process for GaAs/AlGaAs buried quantum wires

    F. Wakaya, K. Umeda, J. Yanagisawa, Y. Yuba, S. Takaoka, K. Murase, and K. Gamo

    Jpn. J. Appl. Phys.   33   7223 - 7227   1994

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  • Ion beam irradiation effect on solubility of spin-on glass to methanol

    J. Yanagisawa, Y.-B. Koh, and K. Gamo

    Nucl. Instr. Methods B   80/81   1128 - 1131   1993

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  • Estimation of damage induced by focused Ga ion beam irradiation

    T. Yamamoto, J. Yanagisawa, K. Gamo, S. Takaoka, and K. Murase

    Jpn. J. Appl. Phys.   32   6268 - 6273   1993

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  • Direct patterning of spin-on glass by focused ion beam irradiation

    Y.-B. Koh, T. Goto, J. Yanagisawa, and K. Gamo

    Jpn. J. Appl. Phys.   31   4479 - 4482   1992

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  • Analysis of high energy ion scattering for the Si(111)7x7 DAS model by computer simulation

    J. Yanagisawa and A. Yoshimori

    Surface Sci.   231   297 - 303   1990

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Books etc

  • GaNパワーデバイスの技術展開

    江川孝志, 他( Role: Contributor)

    サイエンス&テクノロジー(株)  2012.4 

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    Total pages:10   Language:Japanese   Book type:Scholarly book

  • ナノバイオ大事典

    山根恒夫, 松永是, 民谷栄一 監修( Role: Joint author)

    株式会社テクノシステム  2007.1 

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    Total pages:3   Language:Japanese   Book type:Scholarly book

Industrial property rights

  • 窒化物半導体成長用基板

    佐藤一成, 山本喜之, 柳沢淳一

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    Application no:特願2013-176635  Date applied:2013.8

    Patent/Registration no:特許第6181474号  Date registered:2017.7  Date issued:2017.7

    Country of applicant:Domestic  

  • 窒化ガリウム成長用基板及びその製造方法

    柳澤 淳一

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    Application no:特願2005-90957  Date applied:2005.3

    Country of applicant:Domestic  

  • 検査リペア装置

    柳澤 淳一

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    Patent/Registration no:特開2006-269636   Date registered:2005.3  Date issued:2005.3

    Country of applicant:Domestic  

Research Projects

  • 集束イオンビームによるバイオチップ加工

    2003.4

    経常研究  集束イオンビーム、バイオチップ、マスクレス加工

  • 低エネルギーイオンビームプロセスに関する研究

    1993.4

    経常研究  シリコン、シリコン酸化物、薄膜、窒化ガリウム

  • 半導体極微構造加工に関する研究

    1991.4

    経常研究  極微加工、半導体極微構造

Presentations

  • Au-Siイオン照射で形成されるSiO2表面のナノ構造を利用したAuナノ粒子の形成

    内田 真裕人,一宮 正義,番 貴彦,柳澤 淳一

    第70回応用物理学会春季学術講演会  2023.3 

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    Language:Japanese   Presentation type:Oral presentation (general)  

  • 高効率な光触媒効果の発現を目指した金属チタン表面の参加方法の検討と評価

    中翔馬,一宮正義,柳澤淳一

    応用物理学会関西支部第1回+第2回合同講演会  2021.1 

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    Language:Japanese   Presentation type:Poster presentation  

  • AuSiイオン源からのAuおよびSiイオン同時照射と大気中での熱処理による石英ガラス基板内へのAuナノ粒子の形成

    清水洋,一宮正義,柳澤淳一

    応用物理学会関西支部第1回+第2回合同講演会  2021.1 

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    Language:Japanese   Presentation type:Poster presentation  

  • Formation of Au nano-particles by Au and Si ion implantation on SiO2 films using Au-Si alloyed liquid metal ion source and thermal annealing under atmosphere International conference

    Y. Okanishi, H. Shimizu, M. Ichimiya, and J. Yanagisawa

    32nd International Microprocesses and Nanotechnology Conference  2019.10 

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    Language:English   Presentation type:Oral presentation (general)  

  • Ge(110)表面への低エネルギーArイオン照射効果と陽電子消滅を用いた表面構造の研究

    塚元隆太,一宮正義,薮内敦,高宮幸一,木野村淳,柳沢淳一

    第80回 応用物理学会秋季学術講演会  2019.9 

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    Language:Japanese   Presentation type:Oral presentation (general)  

  • Au-Si共晶合金イオン源を用いたイオン注入によるシリコン酸化膜内での金ナノ粒子の形成と評価

    岡西 裕太,一宮 正義,柳沢 淳一

    第66回応用物理学会春季学術講演会  2019.3 

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    Language:Japanese   Presentation type:Oral presentation (general)  

  • Au-Si共晶合金イオン源を用いたイオン注入によるSiO2薄膜内でのAuナノ粒子の形成プロセスの提案と反射率の評価

    岡西 裕太,一宮 正義,柳沢 淳一

    応用物理学会関西支部平成30年度第3回講演会「応用物理から生まれるビジネスの種」  2019.2 

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    Language:Japanese   Presentation type:Poster presentation  

  • Periodic Diamond Pattern Formation on Resist by Simple Orthogonally-Crossed Two Line-Scans of the Electron Beam International conference

    K. Okada, T. Hioki, M. Ichimiya, and J. Yanagisawa

    31st International Microprocesses and Nanotechnology Conference  2018.11 

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    Language:English   Presentation type:Poster presentation  

  • 60 keV Ar Ion Irradiation Effect on Ge(110) Surfaces International conference

    R. Tsukamoto, M. Ichimiya, K. Takamiya, A. Kinomura, and J. Yanagisawa

    31st International Microprocesses and Nanotechnology Conference  2018.11 

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    Language:English   Presentation type:Poster presentation  

  • Ge(110)への60keVアルゴンイオン照射による表面形状効果

    塚元隆太,一宮正義,高宮幸一,木野村淳,柳沢淳一

    第79回 応用物理学会秋季学術講演会  2018.9 

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    Language:Japanese   Presentation type:Oral presentation (general)  

  • Oxidation of Si and Ti surfaces using Oxygen plasma treatment International conference

    S. Koyama and J. Yanagisawa

    The 14th International Symposium on Sputtering & Plasma Processes  2017.7 

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    Language:English   Presentation type:Poster presentation  

  • Formation of Nano-bump Structures of Si(100) Surfaces by Low-Energy Ga Ion Irradiation International conference

    S. Suzue, Y. Matsui, and J. Yanagisawa

    2016 International Microprocesses and Nanotechnology Conference  2016.11 

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    Language:English   Presentation type:Poster presentation  

  • 酸素プラズマを用いた金属チタンの酸化による光触媒材料の形成

    山田将司, 柳沢 淳一

    応用物理学会関西支部平成27年度第3回講演会  2016.2 

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    Language:Japanese   Presentation type:Poster presentation  

  • シリコンおよび窒化シリコン膜表面への低エネルギーガリウムイオン照射効果

    山田将司, 松井 祐斗, 山田逸成, 柳沢 淳一

    第76回応用物理学会秋季学術講演会  2015.9 

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    Language:Japanese   Presentation type:Oral presentation (general)  

  • Control of Size and Shape of Nano-Porous Structure Formed on Ge (110) Surface by High –Energy Focused Ga Ion Beam Irradiation International conference

    M. Yamada and J. Yanagisawa

    2014 International Microprocesses and Nanotechnology Conference  2014.11 

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    Language:English   Presentation type:Poster presentation  

  • Gaイオン照射した窒化シリコン薄膜へのGaN成長におけるイオン照射エネルギーの影響(II)

    松井 祐斗, アザマト オシュラフノフ, 柳沢 淳一

    第75回応用物理学会秋季学術講演会  2014.9 

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    Language:Japanese   Presentation type:Oral presentation (general)  

  • 集束イオンビームを用いたオールドライプロセスによるマイクロ流路デバイス作製プロセスの検討

    安達 正哲, 吉田 黎, 柳沢 淳一

    第61回応用物理学会春季学術講演会  2014.3 

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    Language:Japanese   Presentation type:Oral presentation (general)  

  • Deformable silicone grating fabricated with a photo-imprinted polymer mold International conference

    T. Ishihara, I. Yamada, J. Yanagisawa, J. Nishii, and M. Saito

    26th International Microprocesses and Nanotechnology Conference  2013.11 

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    Language:English   Presentation type:Poster presentation  

  • チタンの陽極酸化を利用した反射型偏光波長フィルタの作製と評価

    横山遼, 山田逸成, 柳沢淳一

    第22回日本光学会年次学術講演会  2013.11 

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    Language:Japanese   Presentation type:Oral presentation (general)  

  • 干渉露光と陽極酸化による酸化チタン格子の形成と光学評価

    横山遼, 山田逸成, 柳沢淳一

    平成25年度応用物理学会九州支部学術講演会  2013.11 

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    Language:Japanese   Presentation type:Oral presentation (general)  

  • Fabrication of silicone grating using a photoimprinted polymer mold and period control by mechanical destortion International conference

    T. Ishihara, I. Yamada, J. Yanagisawa, K. Koyama, T. Inoue, J. Nishii, and M. Saito

    International Conference on Solid State Devices and Materials  2013.9 

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    Language:English   Presentation type:Poster presentation  

  • チタンの陽極酸化を利用した反射型偏光波長フィルタの作製

    横山遼, 山田逸成, 柳沢淳一

    第74回応用物理学会秋季学術講演会  2013.9 

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    Language:Japanese   Presentation type:Oral presentation (general)  

  • Gaイオン照射した窒化シリコン薄膜へのGaN成長におけるイオン照射エネルギーの影響

    オシュラフノフ アザマト, 松井 祐斗, 佐藤 一成, 山本 喜之, 柳沢 淳一

    第74回応用物理学会秋季学術講演会  2013.9 

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    Language:Japanese   Presentation type:Oral presentation (general)  

  • サブ波長周期構造を利用した反射型波長板の作製と評価

    石原隆明, 山田逸成, 柳沢淳一

    第74回応用物理学会秋季学術講演会  2013.9 

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    Language:Japanese   Presentation type:Oral presentation (general)  

  • サブ波長周期構造を利用した反射型波長板

    石原隆明, 山田逸成, 柳沢淳一

    第21回日本光学会年次学術講演会  2012.10 

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    Language:Japanese   Presentation type:Oral presentation (general)  

  • MOCVD による窒化シリコン膜上へのGaN 成長におけるイオン照射効果

    柳沢淳一

    第58回応用物理学関係連合講演会2011年春季  2011.3 

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    Language:Japanese  

  • Effect of Ion Implanted Damage on the Growth of Gallium Nitride on Silicon Nitride Surfaces using Metal-Organic Chemical Vapor Deposition International conference

    K. Ishiizumi, J. Kikkawa, Y. Nakamura, A. Sakai, and J. Yanagisawa

    2010 International Microprocesses and Nanotechnology Conference  2010.11 

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  • Analysis of terahertz electromagnetic waves from undoped GaAs/n-type GaAs epitaxial layer structures using a time-partitioning Fourier transform method

    H. Takeuchi, S. Tsuruta, J. Yanagisawa, H. Yamada, M. Hata, and M. Nakayama

    日本物理学会2010年秋季大会  2010.9 

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    Language:Japanese   Presentation type:Oral presentation (general)  

  • Frequency-tunable terahertz electromagnetic wave emitters based on undoped GaAs/n-type GaAs epitaxial layer structures utilizing sub-picosecond-range carrier-transport processes International conference

    Hideo Takeuchi, J. Yanagisawa, S. Tsuruta, H. Yamada, M. Hata, and M. Nakayama

    The 17th International Conference on Dynamical Processes in Excited States of Solids (DPC'10)  2010.6 

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  • Simple strategy for enhancing terahertz emission from coherent longitudinal optical phonons using undoped GaAs/n-type GaAs epitaxial layer structures International conference

    Hideo Takeuchi , J. Yanagisawa, S. Tsuruta, H. Yamada, M. Hata, and M. Nakayama

    The 37th International Symposium on Compound Semiconductors (ICSC2010)  2010.6 

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  • Polarity reversal of terahertz electromagnetic waves in GaAs-based dilute nitride epitaxial layers

    H. Takeuchi , J. Yanagisawa, J. Hashimoto, and M. Nakayama

    日本物理学会2010年春季大会  2010.3 

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    Language:Japanese   Presentation type:Oral presentation (general)  

  • Layer-thickness dependence on THz electromagnetic wave generation from i-GaAs/n -GaAs epitaxial structures

    S. Tsuruta, H. Takeuchi , J. Yanagisawa, H. Yamada, M. Hata, and M. Nakayama

    日本物理学会2010年春季大会  2010.3 

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    Language:Japanese   Presentation type:Oral presentation (general)  

  • Direction of the surface band bending in GaAs1-xNx investigated by terahertz electromagnetic wave and its quantification using photoreflectance measurements

    H. Takeuchi, Jun Hashimoto, Junichi Yanagisawa, and Masaaki Nakayama

    第20回光物性研究会  2009.12 

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    Language:Japanese   Presentation type:Oral presentation (general)  

  • Maskless formation of patterned gallium nitride layer on low-energy Ga-ion-implanted silicon nitride surface by metal-organic chemical vapor deposition International conference

    K. Ishiizumi, J. Kikkawa, Y. Nakamura, A. Sakai, and J. Yanagisawa

    22nd International Microprocesses and Nanotechnology Conference  2009.11 

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  • Observation and quantification of the direction reversal of the surface band herebending in GaAs1-xNx using terahertz electromagnetic wave and photoreflectance measurements International conference

    Hideo Takeuchi, Junichi Yanagisawa, Jun Hashimoto, and Masaaki Nakayama

    The 8th International Conference on Nitride Semiconductors (ICNS-8)  2009.10 

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  • Generation of intense terahertz electromagnetic wave in undoped GaAs/n-type GaAs epitaxial layer structures

    H. Takeuchi, J. Yanagisawa, T. Hasegawa, and M. Nakayama

    日本物理学会2009年秋季大会  2009.9 

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    Language:Japanese   Presentation type:Oral presentation (general)  

  • Surface modification of SiNx to GaN by Ga ion implantation to form a matrix for selective growth of GaN by MOCVD International conference

    J. Yanagisawa, K. Ishiizumi, and A. Sakai

    16th International Conference on Surface Modification of Materials by Ion Beams  2009.9 

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  • 集束イオンビーム支援堆積法で形成したカーボン系薄膜の機械的特性のイオン種依存性

    柳沢淳一

    電気学会プラズマ・パルスパワー・放電合同研究会  2009.8 

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    Language:Japanese   Presentation type:Oral presentation (general)  

  • Direction reversal of the surface band bending in GaAs-based dilute nitride epitaxial layers investigated by polarity of terahertz electromagnetic waves International conference

    Hideo Takeuchi, Junichi Yanagisawa, and Masaaki Nakayama

    The 14th International Conference on Narrow Gap Semiconductors and Systems (NGSS-14)  2009.7 

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  • Fabrication of micro fluid channel structures by focused ion beam techniques Invited International conference

    J. Yanagisawa, H. Kobayashi, K. Koreyama, and Y. Akasaka

    The MRS 2009 Spring Meeting  2009.4 

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  • FIB-CVD法で作製したカーボン系堆積物におけるアニールの影響

    楊卓真,酒井朗, 柳沢淳一

    第56回応用物理学関係連合講演会2009年春季  2009.3 

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    Language:Japanese   Presentation type:Oral presentation (general)  

  • Gaイオン注入したシリコン窒化膜上へのMOCVDによるGaNの選択成長

    石泉和也, 柳沢淳一, 酒井朗

    第56回応用物理学関係連合講演会2009年春季  2009.3 

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  • 集束イオンビームで形成した多孔質Ge表面構造のプラズマ処理による改質の可能性

    柳沢淳一

    電気学会プラズマ研究会  2008.12 

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  • Enhancement mechanism of terahertz electromagnetic wave emission in undoped GaAs/n-type GaAs epitaxial layer structures

    H. Takeuchi, J. Yanagisawa, T. Hasegawa, and M. Nakayama

    第19回光物性研究会  2008.12 

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  • Annealing effect of deposited materials formed by focused Au or Si ion beam-induced chemical vapor deposition using phenanthrene International conference

    T. Yo, H. Tanaka, T. Nagata, N. Fukata, T. Chikyow, A. Sakai, and J. Yanagisawa

    21th International Microprocesses and Nanotechnology Conference  2008.10 

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  • Intense emission of THz electromagnetic wave from an undoped GaAs/n-type GaAs epitaxial layer structure International conference

    Hideo Takeuchi, J. Yanagisawa, T. Hasegawa, and M. Nakayama

    The 35th International Symposium on Compound Semiconductors (ICSC2008)  2008.9 

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  • Nano-indentation measurement of carbonaceous films formed by focused ion beam-induced chemical vapor deposition (FIB-CVD) using Au or Si ions with phenanthrene International conference

    T. Yo, H. Tanaka, K. Nakamatsu, S. Matsui, A. Sakai, and J. Yanagisawa

    16th International Conference on Ion Beam Modification of Materials  2008.8 

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Teaching Experience

  • 基礎電磁気学(機械)

    2020.4 Institution:滋賀県立大学

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    Level:Undergraduate (specialized) 

  • テクニカルコミュニケーション

    2016.4 Institution:滋賀県立大学

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    Level:Graduate (liberal arts) 

  • 荷電粒子ビーム工学

    2012.4 Institution:滋賀県立大学

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    Level:Postgraduate 

  • 電子デバイス

    2010.4 Institution:滋賀県立大学

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    Level:Undergraduate (specialized) 

  • 量子力学概論

    2009.4 Institution:滋賀県立大学

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    Level:Undergraduate (specialized) 

  • 半導体基礎

    2009.4 Institution:滋賀県立大学

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    Level:Undergraduate (specialized) 

  • 電子システム工学演習Ⅱ

    2009.4 - 2010.3 Institution:滋賀県立大学

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    Level:Undergraduate (specialized) 

  • 電子システム工学実験Ⅱ

    2009.4 - 2010.3 Institution:滋賀県立大学

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    Level:Undergraduate (specialized) 

  • 電子システム工学実験Ⅰ

    2009.4 - 2010.3 Institution:滋賀県立大学

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    Level:Undergraduate (specialized) 

  • 電子材料

    2009.4 - 2010.3 Institution:滋賀県立大学

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    Level:Undergraduate (specialized) 

  • 人間探求学

    2009.4 - 2010.3 Institution:滋賀県立大学

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    Level:Undergraduate (liberal arts) 

  • 電子社会と人間

    2009.4 - 2010.3 Institution:滋賀県立大学

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    Level:Undergraduate (liberal arts) 

  • 電子システム特論

    2009.4 - 2010.3 Institution:滋賀県立大学

  • 人間探求学

    2008.4 Institution:滋賀県立大学

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    Level:Undergraduate (liberal arts) 

  • 電子社会と人間

    2008.4 Institution:滋賀県立大学

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    Level:Undergraduate (liberal arts) 

  • 電子材料

    2008.4 - 2009.3 Institution:滋賀県立大学

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    Level:Undergraduate (specialized) 

  • 電子システム特論

    2008.4 - 2009.3 Institution:滋賀県立大学

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