Papers - TSUCHIYA Akira
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Variation-Sensitive Monitor Circuits for Estimation of Global Process Parameter Variation Reviewed
Islam A. K. M. Mahfuzul, Akira Tsuchiya, Kazutoshi Kobayashi, Hidetoshi Onodera
IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING 25 ( 4 ) 571 - 580 2012.11
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Dual-PLL based on Temporal Redundancy for Radiation-Hardening Reviewed
SinNyoung KIM, Akira TSUCHIYA, Hidetoshi ONODERA
Proceedings of 10th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications 2012.10
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Modeling of Single-Event Failures in Dividerand PFD of PLLs based on Jitter Analysis Reviewed
SinNyoung Kim, Akira Tsuchiya, Hidetoshi Onodera
13th European Conference on Radiation and Its Effects on Components and Systems (RADECS), Sep 2012. 2012.9
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チップ内基板バイアス生成回路のモジュール化設計 Reviewed
釡江典裕, 土谷亮, 小野寺秀俊
情報処理学会DAシンポジウム2012論文集, pp. 55-60, Aug 2012. 2012.8
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Area-effective inductive peaking with interwoven inductor for high-speed laser-diode driver for optical communication system Reviewed
T. Kuboki, Y. Ohtomo, A. Tsuchiya, K. Kishine, H. Onodera
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences E95-A ( 2 ) 479 - 486 2012.2
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Area-Effective Inductive Peaking with Interwoven Inductor for High-Speed Laser-Diode Driver for Optical Communication System Reviewed
Takeshi Kuboki, Yusuke Ohtomo, Akira Tsuchiya, Keiji Kishine, Hidetoshi Onodera
IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES E95A ( 2 ) 479 - 486 2012.2
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A 16Gb/s area-efficient LD driver with interwoven inductor in a 0.18μm CMOS Reviewed
T. Kuboki, Y. Ohtomo, A. Tsuchiya, K. Kishine, H. Onodera
Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC 561 - 562 2012
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Impact of radiation loss in on-chip transmission-line for terahertz applications Reviewed
Akira Tsuchiya, Hidetoshi Onodera
2012 IEEE 16th Workshop on Signal and Power Integrity, SPI 2012 - Proceedings 125 - 128 2012
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A 10.3Gbps transimpedance amplifier with mutually coupled inductors in 0.18-μm CMOS Reviewed
S. Miyawaki, M. Nakamura, A. Tsuchiya, K. Kishine, H. Onodera
2011 International SoC Design Conference, ISOCC 2011 223 - 226 2011
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An area effective forward/reverse body bias generator for within-die variability compensation Reviewed
Norihiro Kamae, Akira Tsuchiya, Hidetoshi Onodera
2011 Proceedings of Technical Papers: IEEE Asian Solid-State Circuits Conference 2011, A-SSCC 2011 217 - 220 2011
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Gradient Resistivity Method for Numerical Evaluation of Anomalous Skin Effect Reviewed
Akira Tsuchiya, Hidetoshi Onodera
2011 15TH IEEE WORKSHOP ON SIGNAL PROPAGATION ON INTERCONNECTS (SPI) 139 - 142 2011
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Variation-sensitive monitor circuits for estimation of die-to-die process variation Reviewed
I.A.K.M. Mahfuzul, A. Tsuchiya, K. Kobayashi, H. Onodera
IEEE International Conference on Microelectronic Test Structures 153 - 157 2011
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レイアウト制約が性能と製造性に与える影響 Reviewed
北島和彦, 砂川洋輝, 土谷亮, 小野寺秀俊, 小野寺秀俊
情報処理学会DAシンポジウム論文集 2010 ( 7 ) 221 - 226 2010.8
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Effect of regularity-enhanced layout on variability and circuit performance of standard cells Reviewed
H. Sunagawa, H. Terada, A. Tsuchiya, K. Kobayashi, H. Onodera
IPSJ Transactions on System LSI Design Methodology 3 130 - 139 2010.2
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A 16Gbps Laser-Diode Driver with Interwoven Peaking Inductors in 0.18-mu m CMOS Reviewed
Takeshi Kuboki, Yusuke Ohtomo, Akira Tsuchiya, Keiji Kishine, Hidetoshi Onodera
IEEE CUSTOM INTEGRATED CIRCUITS CONFERENCE 2010 2010
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Measurement of on-chip transmission-line with stacked split-ring resonators Reviewed
Akira Tsuchiya, Hidetoshi Onodera
2010 IEEE 14th Workshop on Signal Propagation on Interconnects, SPI 2010 - Proceedings 137 - 140 2010
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Effect of regularity-enhanced layout on variability and circuit performance of standard cells Reviewed
Hiroki Sunagawa, Haruhiko Terada, Akira Tsuchiya, Kazutoshi Kobayashi, Hidetoshi Onodera
IPSJ Transactions on System LSI Design Methodology 3 130 - 139 2010
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A design procedure of predictive RF MOSFET model for compatibility with ITRS Reviewed
Sinnyoung Kim, Akira Tsuchiya, Hidetoshi Onodera
Proceedings - IEEE International SOC Conference, SOCC 2010 396 - 399 2010
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A 16Gbps laser-diode driver with interwoven peaking inductors in 0.18-μm CMOS Reviewed
T. Kuboki, Y. Ohtomo, A. Tsuchiya, K. Kishine, H. Onodera
Proceedings of the Custom Integrated Circuits Conference 2010
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Process-sensitive Monitor Circuits for Estimation of Die-to-Die Process Variability Reviewed
A.K.M Mahfuzul Islam, Akira Tsuchiya, Kazutoshi Kobayashi, Hidetoshi Onodera
Tau Workshop 2010, Mar 2010. 2010